ZEISS introduces its new integrated in situ workflow for ZEISS Field Emission Scanning Electron Microscopes (FE-SEM). When researchers need to link material performance to microstructure, which is essential for developing new materials in a highly efficient way, they can now extend their ZEISS FE-SEM with an in situ solution for heating and cooling experiments. traction. This allows them to automatically observe materials such as metals, alloys, polymers, plastics, composites, and ceramics under heat and stress while plotting stress-strain curves on the fly. . They can control all system components from a single PC with a unified software environment that enables unattended automated materials testing for up to 24 hours. Leading imaging facilities and materials research labs in universities, government and industry will also benefit from this new solution.
In situ materials testing in the SEM provides an accurate measurement of the dynamic response of microstructures to mechanical loading under defined temperature conditions. Thanks to the design of the ZEISS Gemini electronic optics, the integration of the hardware in situ is very simple. Materials scientists can easily add information such as local chemical composition or crystallographic orientations using combined analytical techniques (eg, EDS and EBSD). All ZEISS FE-SEMs can be connected to the ZEISS ZEN Core Ecosystem, allowing users to access ZEN Connect, ZEN Intellesis and ZEN Analytics Modules, for example.
Dr. Michael Albiez, Head of ZEISS Research Microscopy Solutions, said: “The ability to quantify materials microstructure and overall mechanical properties in a single, automated, user-independent experimental environment provides researchers with the tools to design next-generation materials for the low-carbon future. economy. The in situ laboratory is not only fully integrated, but service and application support is also included. What makes our solution unique is that users can define multiple regions of interest (ROI) and can therefore be sure that they never miss the interesting areas of their sample.
The solution is available for immediate upgrade on existing ZEISS GeminiSEM 360 & 460 and ZEISS Sigma 500 microscopes or can be purchased together with new systems.
More information in line